References

  • 1. P. Wang, J. Laskin, Angew. Chem. Int. Ed. 47, 6678-6680 (2008)
  • 2. D.C. Lim, R. Dietsche, M. Bubek, T. Ketterer, G. Gantefor, Y.D. Kim, Chem. Phys. Lett. 439, 364-368 (2007)
  • 3. S. Tepavcevic, A.T. Wroble, M. Bissen, D.J. Wallace, Y. Choi, L. Hanley, J. Phys. Chem. B 109, 7134-7140 (2005)
  • 4. S. Lee, L.M. Molina, M.J. Lopez, J.A. Alonso, B. Hammer, B. Lee, S. Seifert, R.E. Winans, J. W. Elam, M.J. Pellin, S. Vajda, Angew. Chem. Int. Ed. 48, 1467-1471 (2009)
  • 5. H.J. Rader, A. Rouhanipour, A.M. Talarico, V. Palermo, P. Samori, K. Mullen, Nat. Mater. 5, 276-280 (2006)
  • 6. N. Thontasen, G. Levita, N. Malinowski, Z. Deng, S. Rauschenbach, K. Kern, J. Phys. Chem. C 114, 17768-17772 (2010)
  • 7. J. Cyriac, T. Pradeep, H. Kang, R. Souda, R.G. Cooks, Chem. Rev. 112, 5356-5411 (2012)
  • 8. K.J. Kitching, H.N. Lee, W.T. Elam, E.E. Johnston, H. MacGregor, R.J. Miller, F. Turecek, B.D. Ratner, Rev. Sci. Instrum. 74, 4832-4839 (2003)
  • 9. M. Volny, W.T. Elam, A. Branca, B.D. Ratner, F. Turecek, Anal. Chem. 77, 4890-4896 (2005)
  • 10. A. Badu-Tawiah, J. Cyriac, R. Cooks, J. Am. Soc. Mass Spectrom. 23, 842-849 (2012)
  • 11. A.K. Badu-Tawiah, C. Wu, R.G. Cooks, Anal. Chem. 83, 2648-2654 (2011)
  • 12. G.E. Johnson, Q. Hu, J. Laskin, Annu. Rev. Anal. Chem. 4, 83-104 (2011)
  • 13. , US20030157269A1, 2003
  • 14. L. Hanley, S.B. Sinnott, Surf. Sci. 500, 500-522 (2002)
  • 15. D.R. Ifa, C. Wu, Z. Ouyang, R.G. Cooks, Analyst 135, 669-681 (2010)
  • 16. S. National Research Council, Plasma Processing of Materials: Scientific Opportunities and Technological Challenges 9780309583756 (National Academies Press, Washington, DC, USA, 1991)
  • 17. A.T. Wroble, J. Wildeman, D.J. Asunskis, L. Hanley, Thin Solid Films 516, 7386-7392 (2008)
  • 18. D.J. Weston, Analyst 135, 661-668 (2010)
  • 19. M.-Z. Huang, C.-H. Yuan, S.-C. Cheng, Y.-T. Cho, J. Shiea, Annu. Rev. Anal. Chem. 3, 4365 (2010)
  • 20. I. Cotte-Rodriguez, R.G. Cooks, Chem. Commun. 2968-2970 (2006)
  • 21. S. Garimella, W. Xu, G. Huang, J.D. Harper, R.G. Cooks, Z. Ouyang, J. Mass Spectrom. 47, 201-207 (2012)
  • 22. J.S. Page, R.T. Kelly, K. Tang, R.D. Smith, J. Am. Soc. Mass Spectrom. 18, 1582-1590 (2007)
  • 23. J.B. Fenn, M. Mann, C.K. Meng, S.F. Wong, C.M. Whitehouse, Mass Spectrom. Rev. 9, 3770 (1990)
  • 24. P. Kebarle, L. Tang, Anal. Chem. 65, 972A-986A (1993)
  • 25. N.B. Cech, C.G. Enke, Mass Spectrom. Rev. 20, 362-387 (2001)
  • 26. D. Douglas, J. French, J. Am. Soc. Mass Spectrom. 3, 398-408 (1992)
  • 27. A.V. Tolmachev, I.V. Chernushevich, A.F. Dodonov, K.G. Standing, Nucl. Instrum. Methods Phys. Res., Sect. B 124, 112-119 (1997)
  • 28. R.T. Kelly, A.V. Tolmachev, J.S. Page, K. Tang, R.D. Smith, Mass Spectrom. Rev. 29, 294312 (2010)
  • 29. K. Giles, S.D. Pringle, K.R. Worthington, D. Little, J.L. Wildgoose, R.H. Bateman, Rapid Commun. Mass Spectrom. 18, 2401-2414 (2004)
  • 30. K.J. Gillig, B.T. Ruotolo, E.G. Stone, D.H. Russell, Int. J. Mass Spectrom. 239, 43-49 (2004)
  • 31. R.W. Ramette, E.B. Sandell, J. Am. Chem. Soc. 78, 4872-4878 (1956)
  • 32. S. Zhou, B.S. Prebyl, K.D. Cook, Anal. Chem. 74, 4885-4888 (2002)
 
Source
< Prev   CONTENTS   Source   Next >