SUMMARY

Table of Contents:

The rapid development in electronics, instrumentation, and computational power has greatly enhanced the power of analytical instruments and has given an impulse for the development of newer analytical techniques. These in turn lead to the development of solution techniques that allow a more advanced and more accurate characterization of impurity ions and, in connection with the analysis of host matrix, also allow the evaluation of environmental effects. The understanding of the local environment and electronic structure of the investigated elements at the atomic scale allows a better understanding of the mechanism for changes of material properties. Theoretically, the changes in the electronic structure caused by the presence of trace elements (dopants), point defects, quantum effects, etc. are difficult to discuss even qualitatively and hardly possible to discuss quantitatively within the framework of conventional solid state physics, as opposite to the case of defect-free crystals. Luckily, there are several experimental methods for analyzing the local environment of atoms and/or ions along with their electronic structure reorganization. Among these methods, X-ray spectroscopy (including XAS. XES, R1XS), and XPS including RPES, especially ones that use synchrotron radiation, occupy a special place being surface-sensitive techniques. This is because many of the processes occur on the surface and the presence of impurities or contaminations at the surface/bulk can affect the performance of the device. This has led to the need for surface/bulk characterization. Nuclear techniques like Rutherford backscattering spectroscopy, nuclear reaction analysis, and thin layer activation analysis can also provide valuable information in this endeavor. This chapter gave an overview of the basic principle and application of these techniques in materials characterization.

The use of newer materials as chemical sensors, detectors, catalysts and as critical components in electronics, computers, and energy conversion devices call for advanced analytical techniques for their chemical and structural characterization. The use of newer analytical techniques can provide a solution to these challenges.

ACKNOWLEDGEMENTS

The work was partially supported by the University of Warsaw, Department of Chemistry (Poland). The author acknowledges support from Elettra Sincrotrone (Italy) and Helm- holtz-Zentrum Dresden-Rossendorf (Germany). The author is grateful to Dr. Renata Ratajczak of the National Centre for Nuclear Research (Poland) and to Dr. Yevgen Meli- khov of Cardiff University (UK) for their invaluable help and insightful discussions during RBS/XPS experiments and data interpretation.

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